How to Choose an Analytical Probe System

Choosing a probe system is like choosing a car. Like a regular car, most basic stations will get you from point A to point Z, but like a car, they have multiple modules and accessories to extend the basic system functionality.

This blog has some nationally very useful information about environmental analysis probe stations, as well as for some of the most common questions students have about them. Continue reading to learn more relevant information about some tips and tricks for choosing to go through an analytical probe station.

What is an Analytical Probe System?

Analytical probe systems, also known as detectors, inspection systems, and probe systems, are typically used for low-volume inspection applications such as research and development, equipment characterization, product development, and failure analysis. They are not typically used in mass production applications such as 247 (24 hours a day 7 days a week - RRB - environments. Some suppliers produce analytical probe systems, but the typical range includes manual, semi-automatic and fully automatic systems.

What are the components of a probe system? There are several key components of a probe system, including.

A base, wafer carrier table

A chuck

A plate

A microscope holder

A microscope motion

Optics and manipulators

You should be aware of three different types of probing systems. Let's go through each one in detail.

1. Manual Probe Stages

Manual systems are usually manually controlled, which means that the wafer carrier and chuck (X, Y, Z and theta), the platen (Z ), the microscope movement (X , Y and Z) and the manipulator (X, Y and Z) are all moved manually by the user. These systems are often used when there is not much equipment to measure or data to collect. Some of the advantages of manual probe systems are that they require minimal training, are easy to set up and change from one setup to another, and they do not require electronic equipment, PCs, or software that involves additional training and setup time.

2. Semi-Automatic Probe Stations

Semi-automatic probe pass-through systems can often be used when measurements are to be made on several or all of these devices. They are also used when students are exposed to small pads or wiring or when control of Z-contact and overload (scrubbing) must be more precisely managed.

Semi-automatic probe systems are used to meet the production requirements of small size wafers and wafer companies. Semi-automatic probe systems include components similar to manual systems except for the stage and controls. The wafer stage is usually programmable (x, y, z, theta) and is moved by controlling the electronics and software. The software adds many features to the inspection system. Typical software packages include navigation windows, wafer maps, and auto-alignment. Using the navigation feature, the user can move the stage in any direction at different speeds or index patterns using either the software or a mechanical joystick. The wafer mapping program allows you to set up the mapping to match the device - wafer size,probe station plane and chip size. You can select which devices to probe, sample all or random patterns, and save the entire setup.

Semi-automatic probing systems are usually controlled externally by GPIB, USB, TCP/IP or serial via a customer-developed graphical user interface (GUI). Programs such as Labview, Matlab, Easyexpert, etc. are often used.

3. Fully automated probe stations

Fully automated analytical probe systems typically include the addition of a material handling unit (MHU or robot) and pattern recognition (auto-alignment). They are typically used in manufacturing or when there are some unique requirements - no manual handling, thin wafers or as multi-purpose systems for wafer testing, wafers mounted on frames, wafers sawed and stretched on frames, carriers or mold trays.

What types of accessories can be used to enhance the probe system?

Wafer chucks, vibration isolation tables, test probe dark boxes, thermal chucks, laser cutters, CCTV systems, probe chucks, packaging part holders, micromanipulator, probe tips, air compressors, vacuum pumps and many more!

To summarize:

There are many businesses with different data types and variations of probe stations! Most probe station information will get you from point A to point Z, but it is critical to understand all of the related accessories and variations of probe stations that are not available in our China market today.

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